ICD recently participated in a large education industry event to share solutions for a smart, safe, secure campus.
The two-day conference and exhibition held in Shanghai, BEED’s 12th Asia School Construction Conference, hosted hundreds of K-12 and university delegates as well as countless experts in the field of school construction and facilities.
The ICD team were on hand at our booth to share information about security systems and advanced solutions for the education sector. We displayed several live tech demos to show how specific technologies can address campus security challenges and increase operational efficiency.
With over 15 years of experience working with schools and universities, we are familiar with commonly faced campus security challenges and best practices. Our solutions for a smarter, safer and more secure campus include:
We also presented various Advanced Solutions for the education industry such as a visitor management solution, smart key and locker management solutions and a school bus solution, helping clients solve unique security challenges whilst increasing operational efficiency, as below:
Campus security 2.0
During the conference’s Campus Safety session, ICD’s Ricky Du, VP, Strategic Accounts & Service APAC, had the chance to deliver a 30-minute speech entitled ‘Campus Security 2.0’. Ricky shared some of the key school security and safety concerns and provided an overview of comprehensive security design for schools.
He explained the concept of ‘campus security 2.0’ where security systems are integrated with a diverse range or facility, building management and other systems to facilitate improved data management, data analysis and enhanced operational efficiency. He finished by introducing some examples of advanced solution for campus safety which utilize security systems or data for purposes ‘beyond traditional security’.
For more information about any of the solutions above, or to improve safety and security at your school, read the articles below or reach out to us on email@example.com.